Q18 · UPSC current affairs · 26 September 2026 · News · Project Suncatcher Space Hardware Testing

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In the context of space hardware testing, a 'Bit Flip Error' is typically caused by which of the following?

A Thermal convection currents operating within the satellite's pressurized cabin.
B Sudden fluctuations in terrestrial power grids during data transmission.
C High-energy subatomic radiation particles altering a memory state from 0 to 1 or vice versa.
D Mechanical vibrations caused by rocket booster separation.

Correct answer: (c) High-energy subatomic radiation particles altering a memory state from 0 to 1 or vice versa.

Explanation

Option C is correct because a bit flip error is a memory state change caused by high-energy subatomic radiation particles hitting semiconductor memory in space. Options A, C, and D are incorrect as they do not describe the primary cause of bit flips in space hardware.

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